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Efficient system-level testing technology

Accelerate the take-off of automotive semiconductors and AIGC

Core technology

Automated aging test solution, improving system efficiency 3 times!
Automated aging test solution, improving system efficiency 3 times!
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High parallel testing number, up to 1024DUTs can be tested at the same time
High parallel testing number, up to 1024DUTs can be tested at the same time
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High-precision vision positioning technology, precise chip pick & place P&P components
High-precision vision positioning technology, precise chip pick & place P&P components
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Perfect 3D AOI system, ensuring product quality and traceability
Perfect 3D AOI system, ensuring product quality and traceability
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News

Power Delivery Test Requirements for High-Current AI Compute
Power Delivery Test Requirements for High-Current AI Compute
2026-08-29
AI compute hardware is entering a higher-power operating regime. In 2026, GPUs based on the NVIDIA Vera Rubin architecture are reaching power levels of up to 3,700 W, more than five times that of the H100. As power density continues to increase, liquid cooling is moving from an optional approach tow
NAND Flash Supply Constraints: The Role of Tri-Temperature Reliability Testing in Production Quality
NAND Flash Supply Constraints: The Role of Tri-Temperature Reliability Testing in Production Quality
2026-08-19
IDC projects that global data volume will exceed 527 ZB by 2029. The growing adoption of generative AI and edge inference devices is driving higher volumes of data generation and storage, reshaping the global supply-demand balance for memory.The current storage shortage is not simply another phase o
HBM Reliability at Scale: Addressing Advanced Memory Testing Challenges
HBM Reliability at Scale: Addressing Advanced Memory Testing Challenges
2026-07-23
High-bandwidth memory (HBM) has become a critical memory technology for the next generation of artificial intelligence (AI) computing and high-performance computing (HPC) systems. As AI workloads continue to expand, the demand for higher memory bandwidth, improved power efficiency, and long-term sys

Why choose Acroview

Innovation
Innovation
Technological leadership
Technological leadership
Continuous focus
Continuous focus
Global service
Global service
Integrate test solutions for different IC, Tray, BIB boards
Global service
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Acroview technology

All-out effort, professional focus
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