Chip Sorting_Semiconductor Testing_Chip Burn-in Testing_Acroview Technology Co., Ltd.

Efficient system-level testing technology

Accelerate the take-off of automotive semiconductors and AIGC

Learn more

Core technology

Automated aging test solution, improving system efficiency 3 times!

Learn more

High parallel testing number, up to 1024DUTs can be tested at the same time

Learn more

High-precision vision positioning technology, precise chip pick & place P&P components

Learn more

Perfect 3D AOI system, ensuring product quality and traceability

Learn more

News

"AI Dreams, A 'Core' Future" – The 2025 ACROVIEW Annual Gala Concludes Successfully

2026-02-02

Time flies, and new glories unfold. On January 23, 2026, ACROVIEW Group's annual meeting themed AI Dreams, "Chip" Future grandly kicked off on the 5th floor of Crowne Plaza Shenzhen Nanshan by Metro. More than a grand gathering to review the group's annual achievements and unite it

Teradyne and Acroview Announce Strategic Partnership to Transform China's Memory Testing Ecosys

2025-06-24

Shenzhen, China –June 17, 2025– In a landmark move for semiconductor testing, Teradyne (NASDAQ: TER) and Acroview Technology Co., Ltd. (ACROVIEW) today formalized a strategic partnership through a signing ceremony at Acroview's Shenzhen headquarters. The event brought together industry leaders including Teradyne's Asia-Pacific VP Richard Hsieh and Acroview CEO Huang Binhua, alongside key clients and semiconductor association representatives.

Acroview shines at NEPCON CHINA 2025, setting a new benchmark for chip programming and testing.

2025-04-28

From April 22nd to 24th, the 33rd China International Electronics Manufacturing Equipment and Microelectronics Industry Exhibition (NEPCON China 2025) successfully concluded at the Shanghai World Expo Exhibition & Convention Center. As a premier annual event for the global electronics manufactur